Reliability and degradation

Reliability and degradation

semiconductor devices and circuits

By D. V. Morgan

1981

ISBN 10: 0471280283
ISBN 13: NA
Publisher: J. Wiley
Author: D. V. Morgan
Publish Date: 1981
Page count: 444
Title: Reliability and degradation
Subtitle: semiconductor devices and circuits
Edition notes: Includes bibliographical references and index.
Subjects: Semiconductors, Reliability.
Contributions: Howes, M. J., Morgan, D. V.
Publish places: Chichester, New York
Series: The Wiley series in solid state devices and circuits
Format: NA
Dimensions: NA
Weight: NA
Pagination: xii, 444 p. :
Page count: 444